NEW MAHR MARSURF CWM 100

Precision, computer-controlled optical measuring instrument with sub-nanometer resolution
Combined 3D measuring system comprising a confocal microscope and white light interferometer
Highest precision with sub-nanometer resolution
Universal suitability for technical, optical and reflective surfaces. Also for surfaces of printed circuit boards and semiconductor products as well as biological tissues
2D surface analysis and measuring evaluations
Topographic 3D surface analysis and measuring evaluations
Intelligent measuring strategies - fast measurements – short measuring times
Microscope image field sizes, easily expandable by fully automatic stitching
Automatic table or object positioning: 100 mm x 100 mm, longer distances on request
A wide range of lenses allows for an ideal adaptation to the measurement object
Solid construction with granite base plate and granite column for the best possible vibration damping
Professional evaluation software based on MountainsMap ©