NEW MAHR MARSURF WM 100

3D white light interferometer measuring system
Maximum precision with sub-nanometer resolution and measuring accuracy
Suitable for all optical and reflective surfaces, fine technical surfaces and surfaces of circuit boards, semi-conductor products and biological tissue
2D surface analysis and measurement evaluations
Topographical 3D surface analysis and measurement evaluations
Fast measurements - short measuring times
Manual table and object positioning in up to 4 axes
Wide choice of lenses for perfect adjustment to the measuring object
Sturdy design with granite base plate
Professional evaluation software based on MountainsMap©