NEW MAHR MARSURF XCR 20
Overview
Roughness and contour measurement at a measuring station with MarSurf XCR 20
The combined measuring station allows both surface roughness and
contour measurements to be performed at a single measuring station.
Depending on the measuring task, either the GD 25 drive unit for surface roughness measurements or the PCV drive unit for contour measurements can be activated.
Both measuring systems are fixed to the measuring stand by means of a combi holder.
Space-saving design: the two drive units can be adapted by means of the corresponding combi holder to MarSurf ST 500 or ST 750 measuring stands
Roughness and contour evaluation from a single measurement
High precision contour and roughness evaluation for components requiring a long stroke and very high resolution with the MarSurf LD 130 / LD 260 measuring system
Quick changeover between roughness and contour measurement by switching within the software platform and swapping mechanical components such as the drive unit and probe
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