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USED 2018 JEOL JSM-IT200LV

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Overview
Manufacturer:
JEOL
Year:
2018
Stock #:
6217764
Description

Jeol JSM-IT200LV InTouchScope Scanning Electron Microscope
IXRF EDS detector included
DOM: 2018
High resolution imaging in HV/LV/SE/BSE
Zeromag-mode for intuitive transition from light-optic to SEM image
Chemical analysis with integrated EDS and live analysis
Multi-touch screen control and wireless operation
Automatic SEM condition setup based on sample type
Simultaneous multiple live image and movie capture
Fast sample navigation at 5x – 300,000x magnifications
Smile View Premium with image sharpening, montaging, position alignment and overlay
Compact floor space: ca. 0,5m²
Specifications Resolution:
High Vacuum mode: 3nm (30kV)*, 4nm (20kV), 8nm (3kV), 15nm (1kV)
Low Vacuum mode: 4nm (30kV)*, 5nm (20kV) BSE
Accelerating voltage: 0,5 -30 kV
Magnification: x5 to x300,000 (Polaroid reference)
LV detector:
Multi-segment BSED (std.)
LV-SED (option)
LV pressure: 10 ∼ 100 Pa
Maximum specimen size:
Observation:125mm diameter
Loadable:152mm
Height:50mm
LGS type stage:
Eucentric goniometer
X=80mm (motorized), Y=40mm (motorized), Z=5mm-48mm
R=360° (endless)
Tilt -10/+90° / (optional: 3- or 5-axis motor drive)
Frame Store: Up to 5120×3840 pixels

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