The Veeco FPP-5000 4-Point Probe simplifies the measurement of resistive properties
of semiconductor wafers and resistive films.
The electronics and probing mechanism is contained in a single compact package.
The rugged cast aluminum housing assures mechanical integrity of the probe mechanism.
The probing mechanism features a constant force probe head which is rigidly fixed in the housing.
Unlike most four point probes and probing stations, which move the probe head into the wafer, the FPP- 5000 is designed so that the wafer is moved into the probe head. This insures constant probe force independent of operator force and wafer thickness.
